Scanning Nanobeam Electron Diffraction for Atomic Scale Tomography.
Microscopy and microanalysis the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada(2023)
摘要
Journal Article Scanning Nanobeam Electron Diffraction for Atomic Scale Tomography Get access Megan E Holtz, Megan E Holtz Department of Metallurgy and Materials Engineering, Colorado School of Mines, Golden, CO, United States Search for other works by this author on: Oxford Academic Google Scholar Andrew Herzing, Andrew Herzing Materials Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, United States Search for other works by this author on: Oxford Academic Google Scholar Brian Gorman Brian Gorman Department of Metallurgy and Materials Engineering, Colorado School of Mines, Golden, CO, United States Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 600–601, https://doi.org/10.1093/micmic/ozad067.290 Published: 22 July 2023
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