Ultraviolet Laser-Driven Ultra-High Transverse Voltage in Bi-2201 Thin Films

The development of high-performance optically induced voltage materials represents a significant challenge within the realm of optical detection. The constraints posed by low induced voltage and extended response times have impeded the practical applicability of optical and thermal radiation detectors. In this investigation, we propose the utilization of superconducting Bi2Sr2CuOy (Bi-2201) as a pulsed laser-induced voltage material, revealing the emergence of notable transverse voltage signals in tilted thin films. A noteworthy peak voltage of 25.12 V is attained upon exposure to ultraviolet pulsed laser (248 nm), with a rapid rise time of merely 60 ns. Furthermore, we establish an empirical equation specific to our laser detection heterostructure, serving as a benchmark for Bi-2201-based laser detection systems. These findings introduce a promising avenue for the expanded practical applications of high-temperature superconductors.